OPTO-EDU A62.4501 All-in-one New Scanning Electron Atomic Force Microscope

                            OPTO-EDU A62.4501 All-in-one New Scanning Electron Atomic Force Microscope

                            OPTO-EDU A62.4501 All-in-one New Scanning Electron Atomic Force Microscope

                            OPTO-EDU A62.4501 All-in-one New Scanning Electron Atomic Force Microscope

                            OPTO-EDU A62.4501 All-in-one New Scanning Electron Atomic Force Microscope

OPTO-EDU A62.4501 All-in-one New Scanning Electron Atomic Force Microscope

INQUIRY PRECISE INQUIRY
Description

Place of Origin:
Beijing, China
Brand Name:
Opto-Edu
Model Number:
A62.4501
Theory:
Scanning Electron Microscope
Drawtube:
Other
Operation modes:
Contact mode, friction mode, extended modes of Tapping, phase
Sample size:
radius≤90mm,H≤20mm
Max. scan range:
X/Y: 20μm, Z: 2μm
Resolution:
X/Y: 0.2 nm, Z: 0.05nm
Scan rate:
0.6Hz~4.34Hz
Scanning control:
XY: 18-bit D/A, Z: 16-bit D/A
Data sampling:
One 14-bit A/D and double 16-bit A/D multiple-channel simultaneously
PC connection:
USB2.0
Windows:
Compatible with Windows 98/2000/XP/7/8
Name:
All-in-one New Scanning Electron Atomic Force
{1}{2}{3}